NanoCalc 4.0

NanoCalc is thin‑film analysis software developed by Mikropack GmbH. It helps researchers and manufacturers determine film thickness and optical properties from spectral measurements, using physics‑based models to match simulated spectra with measured reflectance or transmittance. Designed for precision and ease of use, NanoCalc supports applications in coatings, semiconductors, photovoltaics, optics, and biosensors, delivering fast, repeatable results and clear reporting.

Key capabilities:

• Determines thin‑film thickness and optical constants from spectral data
• Models single films and multi‑layer stacks with commonly used dispersion models
• Includes a materials library (n, k) with options to add custom materials
• Provides automated fitting with parameter constraints and fit‑quality metrics
• Imports data from common formats and exports results, plots, and reports
• Supports typical reflectance and transmittance measurement setups used with UV‑VIS‑NIR spectrometers
• Offers workflow features suited to both R&D and quality control, including recipe‑based analysis and batch processing

Ideal for non‑destructive, optical thin‑film metrology where accuracy, speed, and repeatability are essential.

NanoCalc is developed by Mikropack GmbH. The most popular versions of this product among our users are: 2.1, 2.3 and 4.0. The name of the program executable file is nanocalc.exe.